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2 edition of study of reactive ion etching of gallium arsenide in mixtures of methane and hydrogen plasmas found in the catalog.

study of reactive ion etching of gallium arsenide in mixtures of methane and hydrogen plasmas

Hossein Fariborz Sahafi

study of reactive ion etching of gallium arsenide in mixtures of methane and hydrogen plasmas

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Published by [Middlesex University] in [London] .
Written in English


Edition Notes

Thesis submitted in partial fulfilment of the requirements for the degree of Doctor of Philosophy.

StatementHossein Fariborz Sahafi.
ContributionsMiddlesex University. School of Electronic Engineering.
The Physical Object
Paginationvii, 188 leaves ;
Number of Pages188
ID Numbers
Open LibraryOL13934134M

››More information on molar mass and molecular weight. In chemistry, the formula weight is a quantity computed by multiplying the atomic weight (in atomic mass units) of each element in a chemical formula by the number of atoms of that element present in the formula, then adding all of these products together. Aluminium Arsenide AlAs Arsine AsH3 Cacodylic Acid (CH3)2AsO2H Cadmium Arsenide Cd3As2 Gallium Arsenide GaAs Indium Arsenide InAs Arsenic Oxybromide AsBrO Arsenic Tribromide AsBr3 Arsenic Trichloride AsCl3 Arsenic Oxychloride AsCl3O Arsenic Pentachloride AsCl5 Arsenic Trifluoride AsF3 Arsenic Pentafluoride AsF5 Arsenic Diiodide AsI2 Arsenic. Identification and characterization of shallow impurity states in gallium arsenide and indium phosphide using photothermal ionization spectroscopy Welcome to the IDEALS Repository. JavaScript is disabled for your browser. Some features of this site may not work without it.


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study of reactive ion etching of gallium arsenide in mixtures of methane and hydrogen plasmas by Hossein Fariborz Sahafi Download PDF EPUB FB2

It seems that the etching mechanism is in some sense the inverse of metal organic chemical vapor deposition, with the formation of (CH3^Ga and H,As as reaction products. In order to understand and control these processes, we present results of a GaAs etching study using an ion beam from a Kauf- man source with hydrogen-methane mixtures as feed by: In reactive ion etching (RIE) of ZnO by methane-based plasmas, the predominant ion-surface interactions are considered to occur through small hydrocarbon ions such as CH+ and CH3+.

There exists an increasing interest in the development of low damage, dry etch processes for III–V materials. For the etching of GaAs, a wide range of gases has been employed, including: Cl 2, BCl 3, CCl 4, SiCl 4, CCl 2 F 2 with and without various mixtures of O 2, H 2, He and Ar.

Damage is of particular concern in devices such as MESFETs and HEMTs but it is possible to Author: Steve Osborne, Helen Royal. Two reactive ion etchants, CF4 and SF6, have been compared in terms of plasma characteristics, silicon oxide etch characteristics, extent of RIE damage, and formation of barrier layers on a GaAs surface after oxide etch.

It was found that higher etch rates with lower plasma-induced dc bias can be achieved with SF6 plasma relative to CF4 plasma and that this Cited by:   The plasma parameters and mechanisms of gallium arsenide (GaAs) reactive plasma etching in HCl-Ar and HCl-Cl2 mixtures under constant-current glow discharge conditions were investigated.

The mathematical simulation of plasma helped to establish that the dilution of HCl with argon or chlorine results in opposite changes in the flux densities of chlorine atoms Cited by: 2. Reactive ion etching (RIE) of HgCdTe using hydrogen and methane/hydrogen mixtures has been studied. The hydrogen RIE was found to form a Cd‐rich residue which resulted in a very rough surface and which gradually inhibited via formation.

The addition of methane (∼25%) resulted in smoother etched surfaces and ultimately deeper vias without the by: Reactive ion etching of gallium nitride in silicon tetrachloride plasmasa) I. Adesida, A. Mahajan, and E. Andidehb) Center& Compound Semiconductor Microelectronics and Department of Electrical and.

The reactive ion etching characteristics of gallium nitride (GaN) in silicon tetrachloride plasmas (SiCl 4, /SiCl 4:Ar, and /SiCl 4:SiF 4) in the pressure range between 20 and 80 mTorr have been investigated.

For the pressure range investigated, etch rates are found to be essentially identical for the different gas mixtures and also invariant with by: etching process using in situ etch depth monitoring In this article, we advance the plasma etching of tellurium oxide and show that it is also useful for chalcogenides.

Re-active ion etching RIE with different plasma mixtures in-cluding trifluoromethane CHF 3 and argon, hydrogen and methane, and argon were extensively studied to realize lowCited by: A heated tungsten filament has been used to catalyze the gas phase etching of gallium arsenide with hydrogen chloride at a substrate temperature of K.

Rapid etch rates, between 1 and 3 microns per minute, were obtained in a pure hydrogen chloride ambient in the pressure range of to Pascal. Etching of Gallium Arsenide with atomic hydrogen: Creator: Elzey, John W. Date Issued: Description: An optical interferometric method is used to make in-situ observations of continuous etching of the () GaAs surface during exposure to a known concentration of thermalised hydrogen atoms downstream from an H₂ plasma.

vironment. Methane-based plasmas can overcome those limi-tations, as has been widely reported.7,8 In particular, reactive ion beam etching ~RIBE. of InP using electron cyclotron resonance ~ECR. discharges in CH4/H2/N2 chemistry has re-vealed very good etching characteristics, leaving mirrorlike etched surfaces with no polymer deposition and.

Reactive-ion etching (RIE) is an etching technology used in is a type of dry etching which has different characteristics than wet uses chemically reactive plasma to remove material deposited on plasma is generated under low pressure by an electromagnetic -energy ions from the plasma attack the wafer surface and react with it.

Keywords: Reactive ion etching; Gallium nitride films; Plasmas 1. Introduction Gallium nitride (GaN) is a compound semiconductor with a wide direct band gap ( eV) and chemical stability.

That makes it attractive for the applications of W/blue light emitting diodes and high power tempera- ture devices. The Reactive Ion Etching (RIE) behavior of Si and GaAs in d.c. halomethane-based discharges has been investigated using Glow Discharge Optical Spectroscopy in both emission and absorption modes.

The etching of GaAs was found to be anisotropic and a carbon layer formed on the etched surfaces. Reactive ion etching of vertical GaN mesas by theaddition of CH4 to BCl3/H2/Arinductively coupled plasma Byung-Teak Lee, S-Y Jung, J-L Lee et al.-Etching of Ga-based III - V semiconductors in inductively coupled Ar and -based plasma chemistries J W Lee, C R Abernathy, S J Pearton et al.-Experimental Study of the Influence of.

on reactive ion etching (RIE) InAs, GaSb, or InSb be- cause of their relative newness in terms device utili- zation. The most common gas chemistry for dry etching of III-V semiconductors has been based on chlorine or chlorine- containing gas mixtures, primarily because of the high vol- atilities of Ga, As, P, and Sb chlorides ().

For some ap-File Size: 4MB. etched and subsequently bonded. For plasma etching (reactive ion etching, RIE) at MHz two different processes were used: a) etching in SF 6 (%) at a pressure of 25 Pa for 20 sec, a flow rate of 64 sccm SF 6, and a rf power of W, b) etching in SF 6 /%O 2 mixtures (SF 6: O 2 = 14) at a pressure of Pa for up to   T1 - Anisotropic reactive ion etching of silicon using SF6/O2/CHF3 gas mixtures.

AU - Legtenberg, R. AU - Legtenberg, Rob. AU - Jansen, Henricus V. AU - de Boer, Meint J. AU - Elwenspoek, Michael Curt. PY - /6. Y1 - /6. N2 - Reactive ion etching of silicon in an RF parallel plate system, using SF6/O2/CHF3, plasmas has been by: An experimental study of the reactive ion etching (RIE) of GaP using BCl BCl3 plasmas, under various conditions, and the concomitant effects on the surface roughness and quality.

BCl3 gas has been or even hydrogen could have less impact on surface smoothness [9]. Cyclic deep reactive ion etching with mask replenishment T N Adam, S Kim, P-C Lv et al.-Wafer level bulk titanium ICP etching using SU8 as an etching mask Gang Zhao, Qiong Shu, Yao Tian et al.-Characterization of deep wet etching of fused silica glass for single cell and optical sensor deposition Haixin Zhu, Mark Holl, Tathagata Ray et al.

In this work, reaction ion etching (RIE) induced damage and its impact on device performance have been characterized and evaluated using a variety of characterization techniques for two technologically important gas mixtures: CHF 3 /O 2 for selective oxide etching, and SF 6 /O 2 for selective poly Si or crystalline Si etching.

Current–voltage characteristics of Al/Si Schottky Cited by: gallium arsenide (GaAs) devices Semiconductor integrated-circuit devices that are implemented using gallium arsenide as the intrinsic semiconductor material in preference to, say, m arsenide has certain advantages over other semiconductor materials, in particular in high-speed applications and in the fabrication of optical and optically coupled devices such.

critical. Chlorine-based plasmas are the most commonly used to dry etch gallium arsenide wafers during device manufacturing primarily because of the volatility of the chlorides that are formed by the reaction.

There has been some thought that gold may be used as a catalyst to enhance the etching process. Reactive ion etching (RIE) is an alternate to wet etching.

The most common gases used for the etching of III-V semi- conductors are based on chlorine. In the past, Freon was commonly used for the fabrication of GaAs-based devices. 6'7 The etching selectivity of GaAs to AiGaAs is over. Reactive ion etching of PbZr1−x TixO3 and RuO2 films by environmentally safe gases - Volume 9 Issue 11 - Wei Pan, S.B.

Desu, In K. Yoo, Dilip P. VijayCited by: 20 K using the nm line of an argon ion laser oper- ating at W/cm’. Three samples were examined, a bare GaAs sample, a SiO, on GaAs sample, and a sample with a 2 min sulfide treatment followed by a SiO, cap.

The SiO, layers were thin. This work investigates the reactive ions etching (RIE) physical properties of n-type ZnO using H 2 /CH 4 and H 2 /CH 4 /Ar mixtures by varying the gas flow ratio, the radio-frequency (rf) plasma power and the chamber pressure.

Atomic force microscopy (AFM) results and surface topographies are : Kuang-Po Hsueh, Ren-Jie Hou, Cheng-Huang Kuo, Chun-Ju Tun.

Mechanism of Reactive Ion Etching of 6H-SiC in CHF 3 /O 2 Gas Mixtures p Fast and Anisotropic Reactive Ion Etching of 4H and 6H SiC in NF 3 p Inductively Coupled Plasma Etching of SiC for Power Switching Device Fabrication Mechanism of Reactive Ion Etching of 6H-SiC in CHF 3 /O 2 Gas Mixtures.

Article Preview. Abstract: Add to Author: N. Sieber, Jürgen Ristein, Lothar Ley. phous gallium arsenide prepared by rf-magnetron sputtering technique. The properties of the non-hydrogenated films are: band gap of eV (E04), Urbach energy of meV, stoichiometric composition ([As]/[Ga] = ), and dark conductivity of about x 10¡5()¡1.

Hydrogen was incorporated in the films by the introduc. to a low-temperature plasma with an ion energy below 2eV. To that end, experiments have been carried out in a linear plasma reactor with pure argon and hydrogen plasmas as well as mixtures thereof.

a-C:H thin films deposited with plasma-enhanced chemical vapour deposition (PE-CVD) are used as a model material–22 The incident ion flux is. Deposition of carbon-doped gallium arsenide was car-ried out in a horizontal, square duct reactor using triisobutyl-gallium ~TIBGa!, tertiarybutylarsine ~TBAs.

and carbon tet-rachloride. The substrates were n-type ~Si. GaAs~. miscut ° towards [email protected]# direction. The reactor pressure was constant at 20 Torr, and palladium-diffused hydrogen a.

Inductively coupled plasma reactive ion etching of Ge doped silica glasses and SiON was investigated, using C2F6- and NF3-based gas mixtures.

Mesas with smooth surfaces and vertical sidewalls were obtained, with a maximum etch rate of about nm/min in the case of C2F6 RIE of Ge-SiO2 and nm/min in the case of SiON.

The NF3 plasma yielded slightly Author: N.J. Kim, S.Y. Lee, G.K. Lee, J.H. Moon, Byung Teak Lee. J.-P. Etrillard, “Reactive ion etching of gallium arsenide in CCl 2 F 2 and SiCl 4, plasmas: influence of chamber material and etching mask”, Jpn.

Cited by: 4. GALLIUM ARSENIDE can react with steam, acids and acid fumes. Reacts with bases with evolution of hydrogen. Attacked by cold concentrated hydrochloric acid. Readily attacked by the halogens. The molten form attacks quartz. (NTP, ). EXPERIMENTAL, GaAs, PLASMA ETCHING, RATE CONSTANTS: Abstract: Known chlorine atom concentrations were prepared in a discharge flow system and used to etch the () face of a gallium arsenide single crystal.

The etch rate was monitored by mass spectrometry, laser interferometry, and surface profilometry. The ion beam etching (IBE) is a physical dry etch process. Thereby argon ions are radiated onto the surface as an ion beam with about 1 to 3 keV. Because of the energy of the ions, they strike out material of the surface.

The wafer is held perpendicular or tilted into the ion beam, the etch progress is absolute anisotropic. The aim of this study was to determine the effects of gallium arsenide (GaAs) laser on IGF-I, MyoD, MAFbx, and TNF-α gene expression during the intermediate phase of muscle regeneration after cryoinjury 21 Wistar rats were divided into three groups (n = 7 per group): untreated with no injury (control group), cryoinjury without GaAs (injured group), and cryoinjury with GaAs.

INFLUENCE OF GOLD PARTICLES ON GALLIUM ARSENIDE SUBSTRATE WHEN ETCHED IN CHLORINE PLASMA By Erika Courtney Lent May Chair: Claudia Milz Major Department: Materials Science and Engineering Gallium arsenide is a valuable semiconductor material used in many applications including microelectronic devices, optoelectronics, and integrated circuits.

Below, we examine the adsorption and reaction of hydrogen, trimethylgallium, arsine and carbon tetrachloride on gallium arsenide () surfaces [6,7,9].

Hydrogen adsorption has been studied for several reasons. This gas plays a special role in promoting the consumption of the alkyl radicals, and it helps maintain a clean growth surface. T1 - Deep reactive ion etching of fused silica using a single-coated soft mask layer for bio-analytical applications.

AU - Ray, Tathagata. AU - Zhu, Haixin. AU - Meldrum, Deirdre. PY - /9/1. Y1 - /9/1Cited by: Growth front of gallium-arsenide crystals determined by synchrotron X-rays SPring-8, the largest third-generation (8 GeV) synchrotron radiation facility in the world, provides the most powerful.2 plasmas, including consideration of the effects of trace O 2 contamination (from air impurity).

Such analyses, along with the results from our extensive recent study of MW activated CH 4/Ar/H 2 gas mixtures in this same reactor,24–27 are necessary precursors to the detailed investigation of the gas-phase chemistry in MW activated B 2H 6/Ar Cited by: